The course provides introduction to dual beam (SEM - FIB) system Helios 660 G3, and its specific features, and also provides guidelines for standard operation.
Training overview of Leica coater ACE 600 located in Structural Analysis
Laboratory of CEITEC Nano. It contains basic information about the
training, rules that must be followed, and documents that help users
operate the device.
Guarantor: Kateřina Tmejová and Jiří Holas
course contains instructions for operating the MIRA 3 XMU electron microscope placed in CEITEC Nano's Structural Analysis (StAn) cleanroom. Do not confuse it with the MIRA microscope in the Nanofabrication section.
Additional resources are also provided. Finish the Final test before the
practical training. It is highly recommended to go through the Startup procedure, Measurement, and Turning off procedure lessons in the Instrument control section before attempting to pass the Final test - Mira 3 XMU.
The course is targeted at the beginner user. It aims to introduce safety and operational instruction about X-ray laboratories, diffractometers, sample preparation, and data handling. The practical presentation contains the setting up of diffractometer Rigaku 3 to Bragg-Brentano mode, measurement powder data, and analyses of it.
The presentation of the different methods, such as XRR, stress, pole-figure, and measurement on single-crystals, translucent samples, or with automatic sample changer, are on the request.Guarantor: Pavla Roupcová
Overview of devices for TEM sample preparation in Structural Analysis
Laboratory of CEITEC Nano. It contains basic information about the training, rules that must be followed, and documents that help users operate the devices.
Device for ion polishing samples for scanning electron microscopy beam of light ions, enabling the creation of precise cross sections fragile, heterogeneous, porous and temperature sensitive materials for their studies by scanning electron microscopy and analytical methods EBSD, EDS and WDS. Furthermore, the instrument allows ion polishing large surfaces at oblique incidence of the ion beam for studying the foregoing materials mentioned methods.
Provides a concise introduction into the Ultra High-Resolution Scanning Electron Microscope (UHR SEM) FEI Verios 460L and a knowledge base to prepare the new user for onsite instrument training.
After going through this course, you will be prepared to enroll to the Verios_basic training.