Electron Microscopy is a technique especially for obtaining high-resolution images using an accelerated electron beam to probe the investigated sample. After finishing this course, you will get familiar with the concept of resolution and its limits, an introduction to electron optics, the basics of electron-matter interaction, and a list of corresponding analytical techniques and instruments available in Ceitec Nano core facilities. This course is a prerequisite for all SEM instruments.
The aim of this course is to provide an overview of fundamental knowledge of Scanning Probe Microscopy (SPM). You will get familiar with technical background, principles, imaging artifacts, basic measurement modes (contact, non-contact, tapping mode), and various methods (STM, AFM, MFM, KPFM,...).
Guarantor: Evelína Gablech
Course prerequisite: Complete L1 Electron microscopy basics (score 20 points in quizzes)
This course is a prerequisite for all SEM instruments.
- Teacher: Eva Kolíbalová