Electron Microscopy is a technique especially for obtaining high-resolution images using an accelerated electron beam to probe the investigated sample. After finishing this course, you will get familiar with the concept of resolution and its limits, an introduction to electron optics, the basics of electron-matter interaction, and a list of corresponding analytical techniques and instruments available in Ceitec Nano core facilities. This course is a prerequisite for all SEM instruments.  

Course completion requirements: Score 20 points in quizzes (Introduction, Comparisons of Microscopes, Instrumentation, Electron-Matter Interaction)

EM Facility Guarantor: Ondřej Man

Course Guarantor: Eva Kolíbalová

Other Lecturers: Tomáš Šamořil, Petr Lepcio, Vojtěch Švarc


The aim of this course is to provide an overview of fundamental knowledge of Scanning Probe Microscopy (SPM). You will get familiar with technical background, principles, imaging artifacts, basic measurement modes (contact, non-contact, tapping mode), and various methods (STM, AFM, MFM, KPFM,...). 

Guarantor: Evelína Gablech


Scanning electron microscope has become an essential tool for material characterization due to its versatility and ease of use. Nevertheless, basic knowledge about the device and possible ways of measuring and dealing with the sample is necessary for correct data interpretation. This Level 2 course aims to provide such information supplemented with several practical tips. After finishing this course, you will get familiar with elementary theoretical and technical background, signal detection, various contrasts generated in SEM, imaging artefacts, and tips on how to deal with them.


Course prerequisite: Complete L1 Electron microscopy basics (score 20 points in quizzes)

Course completion requirements: Score 27 points in quizzes (Working Principle, Resolution in SEM, SEM Column Alignment, Signal Detection, Contrast in SEM, Artifacts in SEM Imaging)

This course is a prerequisite for all SEM instruments.


EM Facility Guarantor: Ondřej Man

Course Guarantor: Eva Kolíbalová

Other Lecturers: Tomáš Šamořil, Petr Lepcio, Vojtěch Švarc

This course is about TEM sample preparation in the Structural Analysis Laboratory of CEITEC Nano. It brings information about ways of preparation and machines which are available for that purpose in our facility.

Guarantor: Jiří Holas