Optical (or Light) Microscopy is a technique for obtaining magnified images using visible light. After finishing this course, you will become familiar with the interaction of light with matter, the concept of resolution and its limits, an introduction to lens optics, and a typical setup of an optical microscope. This course is a prerequisite for other optical techniques.
Electron Microscopy is a technique especially for obtaining high-resolution images using an accelerated electron beam to probe the investigated sample. After finishing this course, you will get familiar with the concept of resolution and its limits, an introduction to electron optics, the basics of electron-matter interaction, and a list of corresponding analytical techniques and instruments available in Ceitec Nano core facilities. This course is a prerequisite for all SEM instruments.
The aim of this course is to provide an overview of fundamental knowledge of Scanning Probe Microscopy (SPM). You will get familiar with technical background, principles, imaging artifacts, basic measurement modes (contact, non-contact, tapping mode), and various methods (STM, AFM, MFM, KPFM,...).
Guarantor: Evelína Gablech
Course prerequisite: Complete L1 Electron microscopy basics (score 20 points in quizzes)
Course completion requirements: Score 27 points in quizzes (Working Principle, Resolution in SEM, SEM Column Alignment, Signal Detection, Contrast in SEM, Artifacts in SEM Imaging)
This course is a prerequisite for all SEM instruments.
- Teacher: Eva Kolíbalová
This course is about TEM sample preparation in the Structural Analysis
Laboratory of CEITEC Nano. It brings information about ways of
preparation and machines which are available for that purpose in our
facility.