The aim of this course is to provide an overview of fundamental knowledge of Scanning Probe Microscopy (SPM). You will get familiar with technical background, principles, imaging artifacts, basic measurement modes (contact, non-contact, tapping mode), and various methods (STM, AFM, MFM, KPFM,...).
Guarantor: Evelína Gablech
This course is about TEM sample preparation in the Structural Analysis
Laboratory of CEITEC Nano. It brings information about ways of
preparation and machines which are available for that purpose in our
This course is under construction.Guarantor: Jiří Holas