The aim of this course is to provide an overview of fundamental knowledge of Scanning Probe Microscopy (SPM). You will get familiar with technical background, principles, imaging artifacts, basic measurement modes (contact, non-contact, tapping mode), and various methods (STM, AFM, MFM, KPFM,...). 

Guarantor: Evelína Gablech

This course is about TEM sample preparation in the Structural Analysis Laboratory of CEITEC Nano. It brings information about ways of preparation and machines which are available for that purpose in our facility.

This course is under construction.

Guarantor: Jiří Holas